Advances in transmission electron microscopy allow researchers to explore the structure of materials at atomic resolutions—and improvements in TEM continue to be made. Yuichi Ikuhara, professor of engineering innovation at the University of Tokyo, discusses his work using scanning TEM to characterize grain boundaries in ceramics, the recent advances that have greatly improved this technique's resolution capabilities, and where he sees TEM headed in the future.

View the transcript for this episode here.

About the guest
Yuichi Ikuhara is professor of engineering innovation at the University of Tokyo, Japan. His group researches the mechanical and functional properties of materials using scanning transmission electron microscopy. An ACerS Fellow, Ikuhara is a member of the Basic Science Division and a firm believer in studying both materials science and microscopy techniques in order to fully understand the properties of materials.

About ACerS
Founded in 1898, The American Ceramic Society is the leading professional membership organization for scientists, engineers, researchers, manufacturers, plant personnel, educators, and students working with ceramics and related materials.